FIB-SEM Systems for High-Precision Imaging & Sample Preparation | Tescan
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tescan.com
ZEISS SEMおよびFIB-SEM
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Using focused ion beam scanning electron microscopy (FIB-SEM), samples are imaged with the SEM before a focused ion beam mills away as little as 3-10 nm. The sample is then imaged again and the process is repeated to build up a high-resolution view of the complete 3D volume. Cryogenic FIB-SEM generates these volumes from vitrified samples and enables the capture of 3D ultraresolution in the near native state. The video illustrates a typical cryogenic FIB-SEM workflow. Learn more about cryogenic
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